RASTERELEKTRONENMIKROSKOP - Traduzione tedesco-inglese

Come desideri usare PONS.com?

Hai già un abbonamento a PONS Pur o PONS Translate Pro?

PONS con annunci

Visita come di consueto PONS.com con tracking e annunci pubblicitari

Puoi trovare informazioni più dettagliate sul tracking nelle Informazioni sulla privacy e nelle Impostazioni sulla privacy.

PONS Pur

Senza pubblicità di fornitori terzi

Senza tracking pubblicitario

Abbonati ora

Se hai già un account utente gratuito per PONS.com puoi abbonarti a PONS Pur .

We process your data to deliver content or advertisements and measure the delivery of such content or advertisements to extract insights about our website. We share this information with our partners on the basis of consent and legitimate interest. You may exercise your right to consent or object to a legitimate interest, based on a specific purpose below or at a partner level in the link under each purpose. These choices will be signaled to our vendors participating in the Transparency and Consent Framework.

Cookies, device or similar online identifiers (e.g. login-based identifiers, randomly assigned identifiers, network based identifiers) together with other information (e.g. browser type and information, language, screen size, supported technologies etc.) can be stored or read on your device to recognise it each time it connects to an app or to a website, for one or several of the purposes presented here.

Advertising and content can be personalised based on your profile. Your activity on this service can be used to build or improve a profile about you for personalised advertising and content. Advertising and content performance can be measured. Reports can be generated based on your activity and those of others. Your activity on this service can help develop and improve products and services.

nel dizionario PONS

tedesco

inglese

Ras·ter(·elek·tro·nen)·mi·kro·skop SOST nt

Raster(elektronen)mikroskop: scanning electron microscope

Raster(elektronen)mikroskop: SEM

inglese

tedesco

scanning electron microscope: Rasterelektronenmikroskop nt <-s, -e>

Glossario di Biologia Klett

scanning electron microscope (SEM): Rasterelektronenmikroskop (REM)

PONS OpenDict

Vuoi aggiungere una parola, una frase o una traduzione?

Inviaci un nuovo contributo per il PONS OpenDict. I suggerimenti inviati vengono esaminati dalla redazione di PONS e inseriti di conseguenza nei risultati.

Aggiungi voce

Esempi dal web (non verificati dalla Redazione di PONS)

[...]

Bei einem Rasterelektronenmikroskop wird ein Elektronenstrahl über die zu untersuchende Probenoberfläche geführt ( Rasterung ).

[...]

chemie.uni-paderborn.de

[...]

In a scanning electron microscope an electron beam is scanned over the surface of a sample ( scanning ).

[...]

chemie.uni-paderborn.de

[...]

Das XL 40 von Philips ist ein Rasterelektronenmikroskop mit extra großer Probenkammer.

[...]

www.mv.uni-kl.de

[...]

The XL 40 manufactured by Philips is a scanning electron microscope with an extra large sample chamber.

[...]

www.mv.uni-kl.de

[...]

Für die Analyse von prozessierten Schichten und Strukturen stehen neben Lichtmikroskopen auch ein Rasterelektronenmikroskop (JEOL) und ein Rasterkraftmikroskop (DME) zur Verfügung.

www.igm.uni-stuttgart.de

[...]

There are several optical microscopes available to analyse the processed layers and structures, as well as a scanning electron microscope (JEOL) and an atomic force microscope (DME).

www.igm.uni-stuttgart.de

[...]

Seit 15 Jahren werden den meisten Erstbeschreibungen Fotos des Samens beigefügt, die unter dem Rasterelektronenmikroskop gemacht wurden - oft als REM-Aufnahmen abgekürzt.

[...]

www.internoto.de

[...]

For 15 years most first descriptions have included photos of the seed, which were made under the scanning electron microscope - often abbreviated to SEM ( REM in German ).

[...]

www.internoto.de

[...]

Focused Ion Beam mit Rasterelektronenmikroskop und angeschlossenem EDX (Zeiss Neon 40) Sputteranlage zur Probenvorbereitung:

chemie.uni-paderborn.de

[...]

Focused Ion Beam with Scanning Electron Microscope and EDX (Zeiss Neon 40) Sputtercoating sample preparation:

chemie.uni-paderborn.de